VLSI testing digital and mixed analogue/digital techniques

VLSI testing digital and mixed analogue/digital techniques

Détails bibliographiques
Auteur principal: Hurst, Stanley L.
Format: Livre
Langue:English
Publié: Herts, U.K. The Institution of Electrical Engineers c1998.
Sujets:
Integrated circuits > Very large scale integration > Testing.
Accès en ligne:Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access