VLSI testing digital and mixed analogue/digital techniques

Détails bibliographiques
Auteur principal:	Hurst, Stanley L.
Format:	Livre
Langue:	anglais
Publié:	Herts, U.K. The Institution of Electrical Engineers c1998.
Sujets:	Integrated circuits > Very large scale integration > Testing.
Accès en ligne:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access