VLSI testing digital and mixed analogue/digital techniques

Detalles Bibliográficos
Autor Principal:	Hurst, Stanley L.
Formato:	Libro
Idioma:	inglés
Publicado:	Herts, U.K. The Institution of Electrical Engineers c1998.
Subjects:	Integrated circuits > Very large scale integration > Testing.
Acceso en liña:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access