Advances in X-ray analysis proceedings of the... Annual Conference on Application of X-ray Analysis

Bibliografske podrobnosti
Corporate Authors:	Conference on Applications of X-ray Analysis, Denver. University. Denver University Research Institute
Drugi avtorji:	Mueller, William M., ed, Fay, Marie, ed
Format:	Knjiga
Jezik:	English
Izdano:	Denver 1957- .
Izdaja:	6th ed.
Teme:	X-rays > Industrial applications > Congresses.