Advances in X-ray analysis proceedings of the... Annual Conference on Application of X-ray Analysis

Bibliographic Details
Corporate Authors:	Conference on Applications of X-ray Analysis, Denver. University. Denver University Research Institute
Other Authors:	Mueller, William M., ed, Fay, Marie, ed
Format:	Book
Language:	English
Published:	Denver 1957- .
Edition:	6th ed.
Subjects:	X-rays > Industrial applications > Congresses.