Advances in X-ray analysis proceedings of the... Annual Conference on Application of X-ray Analysis

Bibliografische gegevens
Coauteurs:	Conference on Applications of X-ray Analysis, Denver. University. Denver University Research Institute
Andere auteurs:	Mueller, William M., ed, Fay, Marie, ed
Formaat:	Boek
Taal:	English
Gepubliceerd in:	Denver 1957- .
Editie:	6th ed.
Onderwerpen:	X-rays > Industrial applications > Congresses.