Advances in X-ray analysis proceedings of the... Annual Conference on Application of X-ray Analysis

Detalles Bibliográficos
Corporate Authors:	Conference on Applications of X-ray Analysis, Denver. University. Denver University Research Institute
Outros autores:	Mueller, William M., ed, Fay, Marie, ed
Formato:	Libro
Idioma:	English
Publicado:	Denver 1957- .
Edición:	6th ed.
Subjects:	X-rays > Industrial applications > Congresses.