Soft error reliability of VLSI circuits analysis and mitigation techniques

Bibliografski detalji
Glavni autori:	Ghavami, Behnam (Autor), Raji, Mohsen (Autor)
Format:	Electronic Resource
Jezik:	engleski
Izdano:	Switzerland Springer [2021]
Teme:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Online pristup:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access