Soft error reliability of VLSI circuits analysis and mitigation techniques

Soft error reliability of VLSI circuits analysis and mitigation techniques

Podrobná bibliografie
Hlavní autoři: Ghavami, Behnam (Autor), Raji, Mohsen (Autor)
Médium: Electronic Resource
Jazyk:English
Vydáno: Switzerland Springer [2021]
Témata:
Integrated circuits > Very large scale integration > Reliability.
Electronic circuits.
On-line přístup:Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy
Available for University of the Philippines System via SpringerLink. Click here to access