Soft error reliability of VLSI circuits analysis and mitigation techniques

書誌詳細
主要な著者:	Ghavami, Behnam (著者), Raji, Mohsen (著者)
フォーマット:	Electronic Resource
言語:	English
出版事項:	Switzerland Springer [2021]
主題:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
オンライン･アクセス:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access