Soft error reliability of VLSI circuits analysis and mitigation techniques

Soft error reliability of VLSI circuits analysis and mitigation techniques

Dades bibliogràfiques
Autors principals: Ghavami, Behnam (Autor), Raji, Mohsen (Autor)
Format: Electronic Resource
Idioma:English
Publicat: Switzerland Springer [2021]
Matèries:
Integrated circuits > Very large scale integration > Reliability.
Electronic circuits.
Accés en línia:Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy
Available for University of the Philippines System via SpringerLink. Click here to access