Soft error reliability of VLSI circuits analysis and mitigation techniques

Opis bibliograficzny
Główni autorzy:	Ghavami, Behnam (Autor), Raji, Mohsen (Autor)
Format:	Electronic Resource
Język:	angielski
Wydane:	Switzerland Springer [2021]
Hasła przedmiotowe:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Dostęp online:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access