Soft error reliability of VLSI circuits analysis and mitigation techniques

Bibliografiset tiedot
Päätekijät:	Ghavami, Behnam (Tekijä), Raji, Mohsen (Tekijä)
Aineistotyyppi:	Electronic Resource
Kieli:	English
Julkaistu:	Switzerland Springer [2021]
Aiheet:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Linkit:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access