Soft error reliability of VLSI circuits analysis and mitigation techniques

গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক:	Ghavami, Behnam (Author), Raji, Mohsen (Author)
বিন্যাস:	Electronic Resource
ভাষা:	English
প্রকাশিত:	Switzerland Springer [2021]
বিষয়গুলি:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
অনলাইন ব্যবহার করুন:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access