Soft error reliability of VLSI circuits analysis and mitigation techniques

Xehetasun bibliografikoak
Egile Nagusiak:	Ghavami, Behnam (Egilea), Raji, Mohsen (Egilea)
Formatua:	Electronic Resource
Hizkuntza:	English
Argitaratua:	Switzerland Springer [2021]
Gaiak:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Sarrera elektronikoa:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access