Soft error reliability of VLSI circuits analysis and mitigation techniques

Soft error reliability of VLSI circuits analysis and mitigation techniques

Библиографические подробности
Главные авторы: Ghavami, Behnam (Автор), Raji, Mohsen (Автор)
Формат: Electronic Resource
Язык:English
Опубликовано: Switzerland Springer [2021]
Предметы:
Integrated circuits > Very large scale integration > Reliability.
Electronic circuits.
Online-ссылка:Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy
Available for University of the Philippines System via SpringerLink. Click here to access