Soft error reliability of VLSI circuits analysis and mitigation techniques

Bibliografske podrobnosti
Main Authors:	Ghavami, Behnam (Author), Raji, Mohsen (Author)
Format:	Electronic Resource
Jezik:	English
Izdano:	Switzerland Springer [2021]
Teme:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Online dostop:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access