Cita APA (7th ed.)

Tuomisto, F. (2019). Characterisation and control of defects in semiconductors. The Institution of Engineering and Technology. https://doi.org/10.1049/PBCS045E

Cita Chicago (17th ed.)

Tuomisto, Filip. Characterisation and Control of Defects in Semiconductors. London, United Kingdom: The Institution of Engineering and Technology, 2019. https://doi.org/10.1049/PBCS045E.

Cita MLA (9th ed.)

Tuomisto, Filip. Characterisation and Control of Defects in Semiconductors. The Institution of Engineering and Technology, 2019. https://doi.org/10.1049/PBCS045E.