Tuomisto, F. (2019). Characterisation and control of defects in semiconductors. The Institution of Engineering and Technology. https://doi.org/10.1049/PBCS045E
Citazione stile Chigago Style (17a edizione)Tuomisto, Filip. Characterisation and Control of Defects in Semiconductors. London, United Kingdom: The Institution of Engineering and Technology, 2019. https://doi.org/10.1049/PBCS045E.
Citatione MLA (9a ed.)Tuomisto, Filip. Characterisation and Control of Defects in Semiconductors. The Institution of Engineering and Technology, 2019. https://doi.org/10.1049/PBCS045E.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.