Tuomisto, F. (2019). Characterisation and control of defects in semiconductors. The Institution of Engineering and Technology. https://doi.org/10.1049/PBCS045E
Chicago-Zitierstil (17. Ausg.)Tuomisto, Filip. Characterisation and Control of Defects in Semiconductors. London, United Kingdom: The Institution of Engineering and Technology, 2019. https://doi.org/10.1049/PBCS045E.
MLA-Zitierstil (9. Ausg.)Tuomisto, Filip. Characterisation and Control of Defects in Semiconductors. The Institution of Engineering and Technology, 2019. https://doi.org/10.1049/PBCS045E.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.