Tuomisto, F. (2019). Characterisation and control of defects in semiconductors. The Institution of Engineering and Technology. https://doi.org/10.1049/PBCS045E
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रTuomisto, Filip. Characterisation and Control of Defects in Semiconductors. London, United Kingdom: The Institution of Engineering and Technology, 2019. https://doi.org/10.1049/PBCS045E.
एमएलए (9वां संस्करण) प्रशस्ति पत्रTuomisto, Filip. Characterisation and Control of Defects in Semiconductors. The Institution of Engineering and Technology, 2019. https://doi.org/10.1049/PBCS045E.
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