Multi-run memory tests for pattern sensitive faults

Bibliografiska uppgifter
Huvudupphovsman:	Mrozek, Ireneusz (Författare, medförfattare)
Institutionell upphovsman:	SpringerLink (Online service)
Materialtyp:	Electronic Resource
Språk:	English
Publicerad:	Cham Springer International Publishing [2019]
Upplaga:	First edition.
Ämnen:	Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books.
Länkar:	Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy