Multi-run memory tests for pattern sensitive faults

Bibliographische Detailangaben
1. Verfasser:	Mrozek, Ireneusz (VerfasserIn)
Körperschaft:	SpringerLink (Online service)
Format:	Electronic Resource
Sprache:	English
Veröffentlicht:	Cham Springer International Publishing [2019]
Ausgabe:	First edition.
Schlagworte:	Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books.
Online Zugang:	Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy