Multi-run memory tests for pattern sensitive faults

Bibliografiske detaljer
Hovedforfatter:	Mrozek, Ireneusz (Author)
Institution som forfatter:	SpringerLink (Online service)
Format:	Electronic Resource
Sprog:	English
Udgivet:	Cham Springer International Publishing [2019]
Udgivelse:	First edition.
Fag:	Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books.
Online adgang:	Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy