Multi-run memory tests for pattern sensitive faults

Dades bibliogràfiques
Autor principal:	Mrozek, Ireneusz (Autor)
Autor corporatiu:	SpringerLink (Online service)
Format:	Electronic Resource
Idioma:	English
Publicat:	Cham Springer International Publishing [2019]
Edició:	First edition.
Matèries:	Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books.
Accés en línia:	Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy