APA aipamena

Head, A. K., Humble, P., Clarebrough, L. M., Morton, A. J., & Forwood, C. T. (1973). Computed electron micrographs and defect identification. North-Holland.

Chicago Style aipamena

Head, A. K., P. Humble, L. M. Clarebrough, A. J. Morton, and C. T. Forwood. Computed Electron Micrographs and Defect Identification. Amsterdam: North-Holland, 1973.

MLA aipamena

Head, A. K., et al. Computed Electron Micrographs and Defect Identification. North-Holland, 1973.