Cita APA (7th ed.)

Head, A. K., Humble, P., Clarebrough, L. M., Morton, A. J., & Forwood, C. T. (1973). Computed electron micrographs and defect identification. North-Holland.

Cita Chicago (17th ed.)

Head, A. K., P. Humble, L. M. Clarebrough, A. J. Morton, i C. T. Forwood. Computed Electron Micrographs and Defect Identification. Amsterdam: North-Holland, 1973.

Cita MLA (9th ed.)

Head, A. K., et al. Computed Electron Micrographs and Defect Identification. North-Holland, 1973.