Diffraction and imaging techniques in material science

Xehetasun bibliografikoak
Beste egile batzuk:	Amelinckx, S. (Severin) (Argitaratzailea), Gevers, R. (Argitaratzailea), Landuyt, J. van (Argitaratzailea)
Formatua:	Electronic Resource
Hizkuntza:	ingelesa
Argitaratua:	Amsterdam Elsevier [1978]
Edizioa:	Second edition.
Gaiak:	Electron microscopy > Congresses. Electrons > Diffraction > Congresses. Imaging systems > Congresses. Electronic books.
Sarrera elektronikoa:	Available for University of the Philippines System via ScienceDirect. Click here to access Vol. 1 Also available remotely for University of the Philippines System via ScienceDirect. Click here to access Vol. 1 thru EZproxy Available for University of the Philippines System via ScienceDirect. Click here to access Vol. 2 Also available remotely for University of the Philippines System via ScienceDirect. Click here to access Vol. 2 thru EZproxy