Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS
| Hoofdauteurs: | , , |
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| Coauteur: | |
| Formaat: | Electronic Resource |
| Taal: | English |
| Gepubliceerd in: |
Cham
Springer
[2017]
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| Onderwerpen: | |
| Online toegang: | Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy |