Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS
| Auteurs principaux: | , , |
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| Collectivité auteur: | |
| Format: | Electronic Resource |
| Langue: | English |
| Publié: |
Cham
Springer
[2017]
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| Sujets: | |
| Accès en ligne: | Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy |