Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS

Detaylı Bibliyografya
Asıl Yazarlar:	Posser, Gracieli (Yazar), Sapatnekar, Sachin S. 1967- (Yazar), Reis, Ricardo (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	Electronic Resource
Dil:	English
Baskı/Yayın Bilgisi:	Cham Springer [2017]
Konular:	Logic circuits. Electrodiffusion. Electronic books.
Online Erişim:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy