Posser, G., Sapatnekar, S. S., & Reis, R. (2017). Electromigration inside logic cells: Modeling, analyzing and mitigating signal electromigration in NanoCMOS. Springer. https://doi.org/10.1007/978-3-319-48899-8
Chicago Style (17th ed.) CitationPosser, Gracieli, Sachin S. Sapatnekar, and Ricardo Reis. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. Cham: Springer, 2017. https://doi.org/10.1007/978-3-319-48899-8.
MLA (9th ed.) CitationPosser, Gracieli, et al. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. Springer, 2017. https://doi.org/10.1007/978-3-319-48899-8.
Warning: These citations may not always be 100% accurate.