Posser, G., Sapatnekar, S. S., & Reis, R. (2017). Electromigration inside logic cells: Modeling, analyzing and mitigating signal electromigration in NanoCMOS. Springer. https://doi.org/10.1007/978-3-319-48899-8
Citação do estilo Chicago (17ª ed.)Posser, Gracieli, Sachin S. Sapatnekar, e Ricardo Reis. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. Cham: Springer, 2017. https://doi.org/10.1007/978-3-319-48899-8.
Citação MLA (9ª ed.)Posser, Gracieli, et al. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. Springer, 2017. https://doi.org/10.1007/978-3-319-48899-8.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.