The Difficulty in designing Shewhart X and X control charts with estimated parameters

Bibliographic Details
Published in:	Journal of quality technology 47, 2 (2015 (Ap)).
Main Author:	Saleh, Nesma A
Other Authors:	Mahmoud, Mahmoud A., Keefe, Matthew J., Woodall, William H.
Format:	Article
Language:	English
Subjects:	Estimation effect. Shewhart control chart. Standard deviation of average run length. SPC. Statistical process control.