Analysis of defect structures in silicon solar cell materials
Three (3) solar cells fabricated from EFG ribbons were subjected to quantitative defect analysis on several surface planes. The internal planes were observed by removing surface layers of silicon atoms by chemical dissolution. The results show that the average dislocation pit density varies from one...
| Xuất bản năm: | Philippine Engineering Journal 6, 1 (1985). |
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| Tác giả chính: | |
| Định dạng: | Bài viết |
| Ngôn ngữ: | English |
| Truy cập trực tuyến: | Also available online for University of the Philippines Diliman. Click here |