Scanning electron microscopy and x-ray microanalysis
| Autor principal: | |
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| Formato: | Electronic Resource |
| Idioma: | English |
| Publicado em: |
New York
Springer
[2003]
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| Edição: | Third edition. |
| Assuntos: | |
| Acesso em linha: | Available for University of the Philippines Diliman College of Engineering via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman College of Engineering via SpringerLink. Click here to access thru EZproxy |