Analysis of LPC data for wafer yield improvement using a combined data mining and visualization technique

Analysis of LPC data for wafer yield improvement using a combined data mining and visualization technique

Détails bibliographiques
Publié dans:Industrial engineering & management systems 2, 2 (2003 (D)).
Auteur principal: Tien-Lung Sun
Autres auteurs: Chih-Cheng Tsai
Format: Article
Langue:English
Sujets:
IC manufacturing.
Data mining tree.
Data visualization.
Parallel coordinates.
Decision tree.