Investigation of the effect of varying silicon die size and thickness on a small outline transistor on the silicon die crack using finite element method

Bibliographic Details
Main Author:	Ducusin, Hannah Erika R. (Author)
Other Authors:	Dimagiba, Richard Raymond N. (adviser.), Mena, Manolo G. (adviser.)
Format:	Thesis
Language:	English
Subjects:	Transistors.