VLSI testing digital and mixed analogue/digital techniques

The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategi...

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מידע ביבליוגרפי
מחבר ראשי:	Hurst, Stanley L. (Author)
פורמט:	Electronic Resource
שפה:	אנגלית
יצא לאור:	London, United Kingdom Institution of Engineering and Technology 1998.
נושאים:	Integrated circuits > Very large scale integration > Testing. Application-specific integrated circuits. Electronic books.
גישה מקוונת:	Available for University of the Philippines Diliman via IET Digital Library. Click here to access Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy