VLSI testing digital and mixed analogue/digital techniques

VLSI testing digital and mixed analogue/digital techniques

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The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategi...

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Podrobná bibliografie
Hlavní autor: Hurst, Stanley L. (Autor)
Médium: Electronic Resource
Jazyk:English
Vydáno: London, United Kingdom Institution of Engineering and Technology 1998.
Témata:
Integrated circuits > Very large scale integration > Testing.
Application-specific integrated circuits.
Electronic books.
On-line přístup:Available for University of the Philippines Diliman via IET Digital Library. Click here to access
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