Terrestrial radiation effects in ULSI devices and electronic systems

מידע ביבליוגרפי
מחבר ראשי:	Ibe, Eishi H. (Author)
פורמט:	Electronic Resource
שפה:	English
יצא לאור:	Singapore John Wiley & Sons Singapore Pte. Ltd. 2015.
נושאים:	Electronic circuits > Effect of radiation on. Integrated circuits > Ultra large scale integration > Reliability. Integrated circuits > Effect of radiation on. Electronic books.
גישה מקוונת:	Available for University of the Philippines Diliman via Wiley Online Library. Click here to access