Elimination of assembly induced package cracks in plastic SOIC

Considerable amount of information and knowledge is available on moisture induced package cracking, especially on surface mount devices. During IC assembly itself, plastic packages are subject to thermal and mechanical stresses which may lead to package cracking or degrade package strength, thus mak...

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Dades bibliogràfiques
Publicat a:Philippine Engineering Journal 18, 1 (1997(Je)).
Autor principal: De Guzman, Jose Cesar
Altres autors: Mena, Manolo G., Epistola, E.
Format: Article
Idioma:English
Matèries:
Accés en línia:Also available online for University of the Philippines Diliman. Click here