Variability in thickness measurements using X-ray fluorescence technique

Variability in thickness measurements using X-ray fluorescence technique

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Thirty units of tin plated Dual In-line Packages were used to evaluate the measurement system for tin thickness using the X-ray Fluorescence technique. The results showed that the system is sensitive to inspector technique and the total measurement error estimate was about 22 microinches. This syste...

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Xehetasun bibliografikoak
Argitaratua izan da:Philippine Engineering Journal 18, 1 (1997(Je)).
Egile nagusia: Baltazar, Immaculada C.
Beste egile batzuk: Mena, Manolo G.
Formatua: Artikulua
Hizkuntza:English
Gaiak:
X-ray fluorescence technique.
Sarrera elektronikoa:Also available online for University of the Philippines Diliman. Click here