Variability in thickness measurements using X-ray fluorescence technique
Thirty units of tin plated Dual In-line Packages were used to evaluate the measurement system for tin thickness using the X-ray Fluorescence technique. The results showed that the system is sensitive to inspector technique and the total measurement error estimate was about 22 microinches. This syste...
| Published in: | Philippine Engineering Journal 18, 1 (1997(Je)). |
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| Format: | Article |
| Language: | English |
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| Online Access: | Also available online for University of the Philippines Diliman. Click here |