Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Détails bibliographiques

Auteur principal:	Stanisavljevic, Milos
Collectivité auteur:	SpringerLink (Online service)
Autres auteurs:	Schmid, Alexandre, Leblebici, Yusuf
Format:	Electronic Resource
Langue:	English
Publié:	New York Springer New York 2011.
Sujets:	Nanoelectromechanical systems > Reliability. Nanoelectronics. Electronic books.
Accès en ligne:	Available for University of the Philippines Diliman via SpringerLink. Click here to access