Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Detaylı Bibliyografya

Yazar:	Stanisavljevic, Milos
Müşterek Yazar:	SpringerLink (Online service)
Diğer Yazarlar:	Schmid, Alexandre, Leblebici, Yusuf
Materyal Türü:	Electronic Resource
Dil:	English
Baskı/Yayın Bilgisi:	New York Springer New York 2011.
Konular:	Nanoelectromechanical systems > Reliability. Nanoelectronics. Electronic books.
Online Erişim:	Available for University of the Philippines Diliman via SpringerLink. Click here to access