Reliability of nanoscale circuits and systems methodologies and circuit architectures
Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...
| المؤلف الرئيسي: | |
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| مؤلف مشترك: | |
| مؤلفون آخرون: | , |
| التنسيق: | Electronic Resource |
| اللغة: | English |
| منشور في: |
New York
Springer New York
2011.
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| الموضوعات: | |
| الوصول للمادة أونلاين: | Available for University of the Philippines Diliman via SpringerLink. Click here to access |