Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Bibliografiska uppgifter
Huvudupphovsman: Stanisavljevic, Milos
Institutionell upphovsman: SpringerLink (Online service)
Övriga upphovsmän: Schmid, Alexandre, Leblebici, Yusuf
Materialtyp: Electronic Resource
Språk:English
Publicerad: New York Springer New York 2011.
Ämnen:
Nanoelectromechanical systems > Reliability.
Nanoelectronics.
Electronic books.
Länkar:Available for University of the Philippines Diliman via SpringerLink. Click here to access