Reliability of nanoscale circuits and systems methodologies and circuit architectures
Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...
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| פורמט: | Electronic Resource |
| שפה: | English |
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New York
Springer New York
2011.
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| גישה מקוונת: | Available for University of the Philippines Diliman via SpringerLink. Click here to access |