Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Главный автор:	Stanisavljevic, Milos
Соавтор:	SpringerLink (Online service)
Другие авторы:	Schmid, Alexandre, Leblebici, Yusuf
Формат:	Electronic Resource
Язык:	English
Опубликовано:	New York Springer New York 2011.
Предметы:	Nanoelectromechanical systems > Reliability. Nanoelectronics. Electronic books.
Online-ссылка:	Available for University of the Philippines Diliman via SpringerLink. Click here to access