Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Bibliografiske detaljer

Hovedforfatter:	Stanisavljevic, Milos
Institution som forfatter:	SpringerLink (Online service)
Andre forfattere:	Schmid, Alexandre, Leblebici, Yusuf
Format:	Electronic Resource
Sprog:	English
Udgivet:	New York Springer New York 2011.
Fag:	Nanoelectromechanical systems > Reliability. Nanoelectronics. Electronic books.
Online adgang:	Available for University of the Philippines Diliman via SpringerLink. Click here to access