Reliability of nanoscale circuits and systems methodologies and circuit architectures

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Dettagli Bibliografici
Autore principale: Stanisavljevic, Milos
Ente Autore: SpringerLink (Online service)
Altri autori: Schmid, Alexandre, Leblebici, Yusuf
Natura: Electronic Resource
Lingua:English
Pubblicazione: New York Springer New York 2011.
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Accesso online:Available for University of the Philippines Diliman via SpringerLink. Click here to access