Nanoscale memory repair

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern MPUs/...

Deskribapen osoa

Xehetasun bibliografikoak

Egile nagusia:	Horiguchi, Masashi
Erakunde egilea:	SpringerLink (Online service)
Beste egile batzuk:	Itoh, Kiyoo 1941-
Formatua:	Electronic Resource
Hizkuntza:	English
Argitaratua:	New York Springer c2011.
Saila:	Integrated circuits and systems
Gaiak:	Semiconductor storage devices > Maintenance and repair. Semiconductor storage devices > Design and construction. Semiconductor storage devices > Reliability. Nanoelectronics. Integrated circuits > Fault tolerance. Electronic books.
Sarrera elektronikoa:	Available for University of the Philippines Diliman via SpringerLink. Click here to access