Microelectronic test structures for CMOS technology

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has...

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Hlavní autor:	Bhushan, Manjul
Korporativní autor:	SpringerLink (Online service)
Další autoři:	Ketchen, Mark B.
Médium:	Electronic Resource
Jazyk:	English
Vydáno:	New York Springer c2011.
Témata:	Metal oxide semiconductors, Complementary > Testing. Electronic books.
On-line přístup:	Available for University of the Philippines Diliman via SpringerLink. Click here to access