Accelerating test, validation and debug of high speed serial interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Fan, Yongquan 1970-
Körperschaft:	SpringerLink (Online service)
Weitere Verfasser:	Zilic, Zeljko
Format:	Electronic Resource
Sprache:	English
Veröffentlicht:	Dordrecht Springer Netherlands 2011.
Schlagworte:	Interface circuits > Testing. Very high speed integrated circuits > Testing. Electronic books.
Online Zugang:	Available for University of the Philippines Diliman via SpringerLink. Click here to access