Accelerating test, validation and debug of high speed serial interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

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Bibliographic Details

Main Author:	Fan, Yongquan 1970-
Corporate Author:	SpringerLink (Online service)
Other Authors:	Zilic, Zeljko
Format:	Electronic Resource
Language:	English
Published:	Dordrecht Springer Netherlands 2011.
Subjects:	Interface circuits > Testing. Very high speed integrated circuits > Testing. Electronic books.
Online Access:	Available for University of the Philippines Diliman via SpringerLink. Click here to access