Accelerating test, validation and debug of high speed serial interfaces
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...
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| 格式: | Electronic Resource |
| 語言: | English |
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Dordrecht
Springer Netherlands
2011.
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| 在線閱讀: | Available for University of the Philippines Diliman via SpringerLink. Click here to access |