Accelerating test, validation and debug of high speed serial interfaces

Accelerating test, validation and debug of high speed serial interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

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Bibliografiska uppgifter
Huvudupphovsman: Fan, Yongquan 1970-
Institutionell upphovsman: SpringerLink (Online service)
Övriga upphovsmän: Zilic, Zeljko
Materialtyp: Electronic Resource
Språk:English
Publicerad: Dordrecht Springer Netherlands 2011.
Ämnen:
Interface circuits > Testing.
Very high speed integrated circuits > Testing.
Electronic books.
Länkar:Available for University of the Philippines Diliman via SpringerLink. Click here to access