Accelerating test, validation and debug of high speed serial interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

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Detaylı Bibliyografya

Yazar:	Fan, Yongquan 1970-
Müşterek Yazar:	SpringerLink (Online service)
Diğer Yazarlar:	Zilic, Zeljko
Materyal Türü:	Electronic Resource
Dil:	English
Baskı/Yayın Bilgisi:	Dordrecht Springer Netherlands 2011.
Konular:	Interface circuits > Testing. Very high speed integrated circuits > Testing. Electronic books.
Online Erişim:	Available for University of the Philippines Diliman via SpringerLink. Click here to access