Accelerating test, validation and debug of high speed serial interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

وصف كامل

التفاصيل البيبلوغرافية
المؤلف الرئيسي: Fan, Yongquan 1970-
مؤلف مشترك: SpringerLink (Online service)
مؤلفون آخرون: Zilic, Zeljko
التنسيق: Electronic Resource
اللغة:English
منشور في: Dordrecht Springer Netherlands 2011.
الموضوعات:
الوصول للمادة أونلاين:Available for University of the Philippines Diliman via SpringerLink. Click here to access