Scanning probe microscopy of functional materials nanoscale imaging and spectroscopy

Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging app...

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Bibliografski detalji
Autor kompanije: SpringerLink (Online service)
Daljnji autori: Kalinin, Sergei V.
Format: Electronic Resource
Jezik:engleski
Izdano: New York Springer c2010.
Teme:
Online pristup:Available for University of the Philippines Diliman via SpringerLink. Click here to access