Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline ??Si3N4 and amorphous (i) CeO2-...
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| Format: | Electronic Resource |
| Jezik: | English |
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New York, NY
Springer New York
2011.
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| Serija: | Springer Theses
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| Online dostop: | Available for University of the Philippines Diliman via SpringerLink. Click here to access |