An optimization approach in water selection in a assembly
The phenomenon of circuit yield of fabricated wafers of integrated circuit chips in the manufacture of semiconductor devices in an assembly/test manufacturing environment is a major factor to consider in the attainment of high delivery reliability and minimum inventory levels of work-in-process duri...
| Argitaratua izan da: | Philippine Industrial Engineering Journal 2, 1 (2005 (Feb)). |
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| Egile nagusia: | |
| Formatua: | Artikulua |
| Hizkuntza: | ingelesa |
| Gaiak: |