Cabello, N. I. F. (2012). X-ray diffractometry and raman spectroscopy investigation of silicon nanowires fabricated via electroless etching.
Chicago Style (17th ed.) CitationCabello, Neil Irvin F. X-ray Diffractometry and Raman Spectroscopy Investigation of Silicon Nanowires Fabricated via Electroless Etching. 2012.
MLA (9th ed.) CitationCabello, Neil Irvin F. X-ray Diffractometry and Raman Spectroscopy Investigation of Silicon Nanowires Fabricated via Electroless Etching. 2012.
Warning: These citations may not always be 100% accurate.