Flauta, R. E. (1999). Characterization of aluminum films deposited on silicon substrate by radio frequency (RF) magnetron sputtering.
Chicago Style (17th ed.) CitationFlauta, Randolph E. Characterization of Aluminum Films Deposited on Silicon Substrate by Radio Frequency (RF) Magnetron Sputtering. 1999.
MLA (9th ed.) CitationFlauta, Randolph E. Characterization of Aluminum Films Deposited on Silicon Substrate by Radio Frequency (RF) Magnetron Sputtering. 1999.
Warning: These citations may not always be 100% accurate.