Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits.

High fault tolerance for transient faults and low-power consumption are key objectives in the design of critical embedded systems. Systems like smart cards, PDAs, wearable computers, pacemakers, defibrillators, and other electronic gadgets must not only be designed for fault tolerance but also for u...

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Pubblicato in:	IEEE Transactions on VLSI systems 12, 3 (2004).
Autore principale:	Maheshwari, A.
Natura:	Articolo
Lingua:	inglese
Soggetti:	102 muW. 20 muW. CMOS circuit performance. MTTF. SPICE. Circuit level simulations. Counters. Deep submicron VLSI circuits. Double exponential current source fault model. Embedded systems. Low-power circuits. Mean time to failure. Power dissipation. Transient fault tolerance. Ultra-low-power consumption. Very large scale integrated circuits.