Cita APA (7th ed.)

Casu, M. An electromigration and thermal model of power wires for a priori high-level reliability prediction. IEEE Transactions on VLSI systems.

Cita Chicago (17th ed.)

Casu, M.R. "An Electromigration and Thermal Model of Power Wires for a Priori High-level Reliability Prediction." IEEE Transactions on VLSI Systems .

Cita MLA (9th ed.)

Casu, M.R. "An Electromigration and Thermal Model of Power Wires for a Priori High-level Reliability Prediction." IEEE Transactions on VLSI Systems, .