APA (7th ed.) Citation

Casu, M. An electromigration and thermal model of power wires for a priori high-level reliability prediction. IEEE Transactions on VLSI systems.

Chicago Style (17th ed.) Citation

Casu, M.R. "An Electromigration and Thermal Model of Power Wires for a Priori High-level Reliability Prediction." IEEE Transactions on VLSI Systems .

MLA (9th ed.) Citation

Casu, M.R. "An Electromigration and Thermal Model of Power Wires for a Priori High-level Reliability Prediction." IEEE Transactions on VLSI Systems, .